XANES, USXES and XPS investigations of electron energy and...

Surface and Interface Analysis 2010 Vol. 42; Iss. 6-7

XANES, USXES and XPS investigations of electron energy and atomic structure peculiarities of the silicon suboxide thin film surface layers containing Si nanocrystals

V. A. Terekhov, S. Yu. Turishchev, K. N. Pankov, I. E. Zanin, E. P. Domashevskaya, D. I. Tetelbaum, A. N. Mikhailov, A. I. Belov, D. E. Nikolichev, S. Yu. Zubkov
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Volume:
42
Year:
2010
Language:
english
Pages:
6
DOI:
10.1002/sia.3338
File:
PDF, 473 KB
english, 2010
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