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Depth profiling analysis of barrier-type anodic aluminium oxide films formed on substrates of controlled roughness
N. Trigoulet, N. Tuccitto, I. Delfanti, A. Licciardello, I. S. Molchan, P. Skeldon, G. E. Thompson, A. Tempez, P. ChaponVolume:
43
Year:
2011
Language:
english
Pages:
4
DOI:
10.1002/sia.3410
File:
PDF, 218 KB
english, 2011