Dual beam depth profiling of organic materials: Variations...

Dual beam depth profiling of organic materials: Variations of analysis and sputter beam conditions

D. Rading, R. Moellers, F. Kollmer, W. Paul, E. Niehuis
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
43
Year:
2011
Language:
english
Pages:
3
DOI:
10.1002/sia.3422
File:
PDF, 230 KB
english, 2011
Conversion to is in progress
Conversion to is failed