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Analysis of organic semiconductor multilayers with Ar cluster secondary ion mass spectrometry
Satoshi Ninomiya, Kazuya Ichiki, Hideaki Yamada, Yoshihiko Nakata, Toshio Seki, Takaaki Aoki, Jiro MatsuoVolume:
43
Year:
2011
Language:
english
Pages:
4
DOI:
10.1002/sia.3587
File:
PDF, 149 KB
english, 2011