Analysis of organic semiconductor multilayers with Ar...

Analysis of organic semiconductor multilayers with Ar cluster secondary ion mass spectrometry

Satoshi Ninomiya, Kazuya Ichiki, Hideaki Yamada, Yoshihiko Nakata, Toshio Seki, Takaaki Aoki, Jiro Matsuo
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Volume:
43
Year:
2011
Language:
english
Pages:
4
DOI:
10.1002/sia.3587
File:
PDF, 149 KB
english, 2011
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