Defect investigations of SiCGe epilayer grown on 6H-SiC

Defect investigations of SiCGe epilayer grown on 6H-SiC

Li Lianbi, Chen Zhiming, Yang Ying, Li Jia, Wang Ning
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Volume:
43
Year:
2011
Language:
english
Pages:
3
DOI:
10.1002/sia.3649
File:
PDF, 203 KB
english, 2011
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