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Considerations of the intermediate oxides via XPS elemental...

Considerations of the intermediate oxides via XPS elemental quantitative analysis for the thickness measurements of ultrathin SiO2 on Si

Fen Liu, Zhijuan Zhao, Liangzhong Zhao, Hai Wang
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Volume:
43
Year:
2011
Language:
english
Pages:
3
DOI:
10.1002/sia.3671
File:
PDF, 77 KB
english, 2011
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