Effects of elastic scattering and analyzer-acceptance angle on the analysis of angle-resolved X-ray photoelectron spectroscopy data
C. J. Powell, W. S. M. Werner, W. SmekalVolume:
43
Year:
2011
Language:
english
Pages:
11
DOI:
10.1002/sia.3689
File:
PDF, 916 KB
english, 2011