X-ray photoelectron spectroscopy depth analysis of metal...

X-ray photoelectron spectroscopy depth analysis of metal oxides by electrospray droplet impact

Yuji Sakai, Satoshi Ninomiya, Kenzo Hiraoka
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Volume:
43
Year:
2011
Language:
english
Pages:
5
DOI:
10.1002/sia.3754
File:
PDF, 1.50 MB
english, 2011
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