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Tip characterizer for atomic force microscopy using singly suspended carbon nanotube
Takumi Inaba, Jianping Xie, Ryohei Sugiyama, Yoshikazu HommaVolume:
44
Year:
2012
Language:
english
Pages:
1
DOI:
10.1002/sia.4813
File:
PDF, 178 KB
english, 2012