Structural electronic study via XPS and TEM of...

Surface and Interface Analysis 2012 Vol. 44; Iss. 8

Structural electronic study via XPS and TEM of subnanometric gold particles protected by calixarenes for silicon surface anchoring

Alice Boccia, Robertino Zanoni, Arturo Arduini, Luca Pescatori, Andrea Secchi
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Volume:
44
Year:
2012
Language:
english
Pages:
1
DOI:
10.1002/sia.4842
File:
PDF, 195 KB
english, 2012
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