Reflectance spectroscopy (UV-Vis-NIR, FTIR) of oxide films. Oxide layers on copper and nickel
M. Lenglet, J. M. Machefert, J. Arsene, P. Leterrible, J. M. Welter, M. Lecalvar, R. FontaineVolume:
12
Year:
1988
Language:
english
Pages:
2
DOI:
10.1002/sia.740120718
File:
PDF, 228 KB
english, 1988