XPS intensity analysis for assessment of thickness and...

XPS intensity analysis for assessment of thickness and composition of thin overlayer films: Application to chemically etched GaAs(100) surfaces

R. W. Bernstein, J. K. Grepstad
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Volume:
14
Year:
1989
Language:
english
Pages:
6
DOI:
10.1002/sia.740140303
File:
PDF, 530 KB
english, 1989
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