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Investigation of the early stages of thin-film growth of Ni on thermally grown SiO2 by means of RBS, AES and TEM
H.-J. Anklam, R. Mattheis, F. ThrumVolume:
14
Year:
1989
Language:
english
Pages:
5
DOI:
10.1002/sia.740140802
File:
PDF, 635 KB
english, 1989