Analysis of epitaxial CdxHg1 − xTe layers using RBS, SIMS...

Surface and Interface Analysis 1989 Vol. 14; Iss. 11

Analysis of epitaxial CdxHg1 − xTe layers using RBS, SIMS and EER

D. J. Diskett, A. J. Avery, G. Blackmore, S. J. C. Irvine, J. Giess, L. E. A. Berlouis
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Volume:
14
Year:
1989
Language:
english
Pages:
8
DOI:
10.1002/sia.740141107
File:
PDF, 519 KB
english, 1989
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