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Secondary ion yield matrix effects in SIMS depth profiles...

Secondary ion yield matrix effects in SIMS depth profiles of Si/Ge multilayers

Greg Gillen, John M. Phelps, Randall W. Nelson, Peter Williams, Steven M. Hues
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Volume:
14
Year:
1989
Language:
english
Pages:
10
DOI:
10.1002/sia.740141114
File:
PDF, 932 KB
english, 1989
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