XPS study of the Sc/SiOx interface at room temperature

XPS study of the Sc/SiOx interface at room temperature

R. Reichl, K. H. Gaukler
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Volume:
17
Year:
1991
Language:
english
Pages:
4
DOI:
10.1002/sia.740171010
File:
PDF, 313 KB
english, 1991
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