![](/img/cover-not-exists.png)
Backscattering method possibilities for precise determination of the oxygen profile in oxide films by the use of the elastic resonance in reaction 16O(4He, 4He)16O at 3.045 MeV of 4He
L. P. Chernenko, A. P. Kobzev, D. A. Korneev, D. M. ShirokovVolume:
18
Year:
1992
Language:
english
Pages:
4
DOI:
10.1002/sia.740180803
File:
PDF, 462 KB
english, 1992