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Characterization of AlGaAs/GaAs interfaces by EELS and high-resolution Z-contrast imaging in scanning transmission electron microscopy (STEM)
H. Lakner, M. Maywald, L. J. Balk, E. KubalekVolume:
19
Year:
1992
Language:
english
Pages:
5
DOI:
10.1002/sia.740190170
File:
PDF, 1.27 MB
english, 1992