Monte-Carlo simulations of the point-to-point resolution in...

Monte-Carlo simulations of the point-to-point resolution in scanning Auger microscopy and x-ray microanalysis of thin overlayers

E. Valamontes, A. G. Nassiopoulos, N. Glezos
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Volume:
19
Year:
1992
Language:
english
Pages:
4
DOI:
10.1002/sia.740190178
File:
PDF, 343 KB
english, 1992
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