Interlaboratory comparison of the depth resolution in...

Interlaboratory comparison of the depth resolution in sputter depth profiling of Ni/Cr multilayers with and without sample rotation using AES, XPS, and SIMS

S. Hofmann, A. Zalar, E.-H. Cirlin, J. J. Vajo, H. J. Mathieu, P. Panjan
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
20
Year:
1993
Language:
english
Pages:
6
DOI:
10.1002/sia.740200803
File:
PDF, 534 KB
english, 1993
Conversion to is in progress
Conversion to is failed