Towards the ultimate limits of depth resolution in sputter...

Towards the ultimate limits of depth resolution in sputter profiling: Beam-induced chemical changes and the importance of sample quality

K. Wittmaack
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Volume:
21
Year:
1994
Language:
english
Pages:
13
DOI:
10.1002/sia.740210602
File:
PDF, 1.37 MB
english, 1994
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