![](/img/cover-not-exists.png)
Fluorine-Induced corrosion of aluminium microchip bond pads: An XPS and AES analysis
K.-H. Ernst, D. Grman, R. Hauert, E. HolländerVolume:
21
Year:
1994
Language:
english
Pages:
6
DOI:
10.1002/sia.740211003
File:
PDF, 538 KB
english, 1994