Auger Si LVV, O KLL and N KLL lineshapes at air-exposed silicon nitride surfaces: Pattern recognition analysis
J. Zemek, T. Vystrcil, B. Lesiak-Orlowska, A. Jablonski, A. LuchesVolume:
21
Year:
1994
Language:
english
Pages:
7
DOI:
10.1002/sia.740211106
File:
PDF, 636 KB
english, 1994