Scanning force microscopy analysis of the surface of...

Scanning force microscopy analysis of the surface of ion-irradiated diamond

C. M. Demanet, S. Shrivastava, J. P. F. Sellschop
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Volume:
23
Year:
1995
Language:
english
Pages:
5
DOI:
10.1002/sia.740230212
File:
PDF, 905 KB
english, 1995
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