Quantitative XPS and AFM surface analysis: Study of a...

Surface and Interface Analysis 1995 Vol. 23; Iss. 6

Quantitative XPS and AFM surface analysis: Study of a patched gold overlayer on graphite

Ph. Gollion, G. Grenet
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Volume:
23
Year:
1995
Language:
english
Pages:
5
DOI:
10.1002/sia.740230612
File:
PDF, 501 KB
english, 1995
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