Critical Oxide Thickness for Efficient Single-Walled Carbon...

Small 2006 Vol. 2; Iss. 7

Critical Oxide Thickness for Efficient Single-Walled Carbon Nanotube Growth on Silicon Using Thin SiO2 Diffusion Barriers

Jason M. Simmons, Beth M. Nichols, Matthew S. Marcus, Olivia M. Castellini, Robert J. Hamers, Mark A. Eriksson
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Volume:
2
Year:
2006
Language:
english
Pages:
8
DOI:
10.1002/smll.200600095
File:
PDF, 454 KB
english, 2006
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