![](/img/cover-not-exists.png)
Measurement of Local Si-Nanowire Growth Kinetics Using In situ Transmission Electron Microscopy of Heated Cantilevers
Christian Kallesøe, Cheng-Yen Wen, Kristian Mølhave, Peter Bøggild, Frances M. RossVolume:
6
Year:
2010
Language:
english
Pages:
7
DOI:
10.1002/smll.200902187
File:
PDF, 824 KB
english, 2010