High-Resolution, Parallel Patterning of Nanoparticles via...

Small 2010 Vol. 6; Iss. 19

High-Resolution, Parallel Patterning of Nanoparticles via an Ion-Induced Focusing Mask

Sukbeom You, Kyuhee Han, Hyoungchul Kim, Heechul Lee, Chang Gyu Woo, Changui Jeong, Woongsik Nam, Mansoo Choi
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Volume:
6
Year:
2010
Language:
english
Pages:
7
DOI:
10.1002/smll.201000892
File:
PDF, 962 KB
english, 2010
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