Nanoparticle patterning: High-Resolution, Parallel Patterning of Nanoparticles via an Ion-Induced Focusing Mask (Small 19/2010)
Sukbeom You, Kyuhee Han, Hyoungchul Kim, Heechul Lee, Chang Gyu Woo, Changui Jeong, Woongsik Nam, Mansoo ChoiVolume:
6
Year:
2010
Pages:
1
DOI:
10.1002/smll.201090063
File:
PDF, 4.07 MB
2010