Charge Trapping by Self-Assembled Monolayers as the Origin...

Small 2012 Vol. 8; Iss. 2

Charge Trapping by Self-Assembled Monolayers as the Origin of the Threshold Voltage Shift in Organic Field-Effect Transistors

Fatemeh Gholamrezaie, Anne-Marije Andringa, W. S. Christian Roelofs, Alfred Neuhold, Martijn Kemerink, Paul W. M. Blom, Dago M. de Leeuw
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Volume:
8
Year:
2012
Language:
english
Pages:
5
DOI:
10.1002/smll.201101467
File:
PDF, 629 KB
english, 2012
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