Investigations of Charge Migration and Charge Trapping in...

Journal of Imaging Science and Technology 2012 / 11 Vol. 56; Iss. 6

Investigations of Charge Migration and Charge Trapping in Fatigued Organic Photoconductors

Tokarski, Zbigniew, Ahn, Yong-Jin, Jung, Soo-Yong
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Volume:
56
Language:
english
Journal:
Journal of Imaging Science and Technology
DOI:
10.2352/j.imagingsci.technol.12.56.6.060501
Date:
November, 2012
File:
PDF, 1.16 MB
english, 2012
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