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The Effect of Heat Treatment on the Bulk Lifetime of Excess Charge Carriers in Silicon †
NULAND, L. M., VAN DER PAUW, L. J.Volume:
3
Language:
english
Journal:
Journal of Electronics and Control
DOI:
10.1080/00207215708937100
Date:
October, 1957
File:
PDF, 2.38 MB
english, 1957