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A Unique Method for Measuring Dielectric Constant of Low Loss Materials at Microwave and Millimeter Wave Frequencies
Tiwari, A K, Rastogi, Alok KumarVolume:
34
Language:
english
Journal:
IETE Journal of Research
DOI:
10.1080/03772063.1988.11436744
Date:
July, 1988
File:
PDF, 401 KB
english, 1988