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Single-pass kelvin force microscopy and dC/dZ imaging: applications for graphene-related nanomaterials
Yu, Jing-jiang, Wu, ShijieVolume:
483
Language:
english
Journal:
Journal of Physics: Conference Series
DOI:
10.1088/1742-6596/483/1/012002
Date:
March, 2014
File:
PDF, 2.91 MB
english, 2014