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[IEEE 2006 Design, Automation and Test in Europe - Munich, Germany (2006.3.6-2006.3.10)] Proceedings of the Design Automation & Test in Europe Conference - Panel: Test and Reliability Challenges in Automotive Microelectronics
Sebeke, C., Jung, C., Harbich, K., Fuchs, S., Schwarz, J., Goehner, P.Year:
2006
DOI:
10.1109/date.2006.243894
File:
PDF, 48 KB
2006