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[IEEE 2016 International Conference on Microelectronic Test Structures (ICMTS) - Yokohama, Japan (2016.3.28-2016.3.31)] 2016 International Conference on Microelectronic Test Structures (ICMTS) - Statistical analysis and modeling of Random Telegraph Noise based on gate delay variation measurement
Mahfuzul Islam, A.K.M., Nakai, Tatsuya, Onodera, HidetoshiYear:
2016
Language:
english
DOI:
10.1109/icmts.2016.7476179
File:
PDF, 794 KB
english, 2016