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[IEEE 2014 IEEE 12th International Conference on Solid -State and Integrated Circuit Technology (ICSICT) - Guilin, China (2014.10.28-2014.10.31)] 2014 12th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) - A PVT variation testing and compensating method for sigle-chip digital- analog mixed TCXO
Li, Haixiao, Li, Shulong, Wu, Dong, Pan, LiyangYear:
2014
Language:
english
DOI:
10.1109/icsict.2014.7021170
File:
PDF, 723 KB
english, 2014