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[IEEE 2015 International SoC Design Conference (ISOCC) - Gyungju, South Korea (2015.11.2-2015.11.5)] 2015 International SoC Design Conference (ISOCC) - Static leakage control in null convention logic standard cells in 28 nm UTBB-FDSOI CMOS
Kim, Jeeson, Kim, Matthew M., Beckett, PaulYear:
2015
Language:
english
DOI:
10.1109/isocc.2015.7401658
File:
PDF, 676 KB
english, 2015