[IEEE 2006 International Workshop on Junction Technology -...

  • Main
  • [IEEE 2006 International Workshop on...

[IEEE 2006 International Workshop on Junction Technology - Shanghai, China (15-16 May 2006)] 2006 International Workshop on Junction Technology - Molecular Dynamic Simulation on Boron Cluster Implantation for Shallow Junction Formation

Li Yuan,, Wei Li,, Min Yu,, Huihui Ji,, Liming Ren,, Ru Huang,, Xing Zhang,, Yangyuan Wang,, Jinyu Zhang,, Oka, H.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2006
Language:
english
DOI:
10.1109/iwjt.2006.1669447
File:
PDF, 3.03 MB
english, 2006
Conversion to is in progress
Conversion to is failed