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[IEEE IEEE Conference on Nanotechnology - San Francisco, CA, USA (12-14 Aug. 2003)] 2003 Third IEEE Conference on Nanotechnology, 2003. IEEE-NANO 2003. - Comparison of quantum correction models for ultratin oxide single- and double-gate MOS structures under the inversion conditions
Yiming Li,, Shao-Ming Yu,, Chien-Shao Tang,, Teng-Sheng Chao,Volume:
2
Year:
2003
Language:
english
DOI:
10.1109/nano.2003.1231708
File:
PDF, 373 KB
english, 2003