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[IEEE 2015 IEEE International Conference on Progress in Informatics and Computing (PIC) - Nanjing, China (2015.12.18-2015.12.20)] 2015 IEEE International Conference on Progress in Informatics and Computing (PIC) - Detection of abnormal trends in electrical data
Zhou, Aihua, Zhu, Lipeng, Hongbin Qiu,, Jie Ding,, Wei Rao,Year:
2015
Language:
english
DOI:
10.1109/pic.2015.7489847
File:
PDF, 629 KB
english, 2015