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[IEEE 2015 28th IEEE International System-on-Chip Conference (SOCC) - Beijing, China (2015.9.8-2015.9.11)] 2015 28th IEEE International System-on-Chip Conference (SOCC) - Session T1B: Tutorial: SoC testing
Huang, Yu, Rajski, JanuszYear:
2015
Language:
english
DOI:
10.1109/socc.2015.7406883
File:
PDF, 182 KB
english, 2015