[IEEE 2016 Annual IEEE Systems Conference (SysCon) - Orlando, FL, USA (2016.4.18-2016.4.21)] 2016 Annual IEEE Systems Conference (SysCon) - Formal analysis of fault tree using probabilistic model checking: A solar array case study
Ammar, Marwan, Hoque, Khaza Anuarul, Mohamed, Otmane AitYear:
2016
Language:
english
DOI:
10.1109/syscon.2016.7490556
File:
PDF, 145 KB
english, 2016