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SPIE Proceedings [SPIE Photoelectronic Detection and Imaging: Technology and Applications '93 - Beijing, China (Monday 17 May 1993)] Photoelectronic Detection and Imaging: Technology and Applications '93 - Test and analysis on variable-integration low-light-level CCD camera signal and noise properties
Bai, Lianfa, Chen, Qian, Li, Yinghui, Zhang, Baomin, Zhou, LiWeiVolume:
1982
Year:
1993
Language:
english
DOI:
10.1117/12.141998
File:
PDF, 146 KB
english, 1993