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SPIE Proceedings [SPIE IS&T/SPIE's Symposium on Electronic Imaging: Science and Technology - San Jose, CA (Sunday 31 January 1993)] Machine Vision Applications in Industrial Inspection - Prototype model for automatic IC bonding inspection
Rajeswari, Mandava, Saravanan, K., Krishnasamy, P., Wu, Frederick Y., Dawson, Benjamin M.Volume:
1907
Year:
1993
Language:
english
DOI:
10.1117/12.144823
File:
PDF, 980 KB
english, 1993