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SPIE Proceedings [SPIE Measurement Technology and Intelligent Instruments - Wuhan, China (Friday 29 October 1993)] Measurement Technology and Intelligent Instruments - Analysis on modern measuring methods of curved surfaces
Tang, Chao-Wei, Liang, Xi-Chang, Zou, Chang-Ping, Zhu, LiVolume:
2101
Year:
1993
Language:
english
DOI:
10.1117/12.156321
File:
PDF, 301 KB
english, 1993