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SPIE Proceedings [SPIE Measurement Technology and Intelligent Instruments - Wuhan, China (Friday 29 October 1993)] Measurement Technology and Intelligent Instruments - Software reliability modeling by gray system theory
Ye, Hong, Tang, Yong-Hong, Zhou, Zu-De, Wang, Chao-Yang, Zhu, LiVolume:
2101
Year:
1993
Language:
english
DOI:
10.1117/12.156386
File:
PDF, 155 KB
english, 1993