SPIE Proceedings [SPIE Photonics for Industrial...

  • Main
  • SPIE Proceedings [SPIE Photonics for...

SPIE Proceedings [SPIE Photonics for Industrial Applications - Boston, MA (Monday 31 October 1994)] Videometrics III - Computerized Structure Clearance Measurement System (CSCMS)

Taylor, Richard, Kubik, Kurt, Bub, Ed, Townson, Peter, El-Hakim, Sabry F.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
2350
Year:
1994
Language:
english
DOI:
10.1117/12.189129
File:
PDF, 406 KB
english, 1994
Conversion to is in progress
Conversion to is failed