![](/img/cover-not-exists.png)
SPIE Proceedings [SPIE Electron Technology Conference 2013 - Ryn, Poland (Tuesday 16 April 2013)] Electron Technology Conference 2013 - Resistive shorts characterization in CMOS standard cells for test pattern generation
Wielgus, Andrzej, Potrykus, Bartosz, Szczepanski, Pawel, Kisiel, Ryszard, Romaniuk, Ryszard S.Volume:
8902
Year:
2013
Language:
english
DOI:
10.1117/12.2031300
File:
PDF, 323 KB
english, 2013