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SPIE Proceedings [SPIE SPIE/COS Photonics Asia - Beijing, China (Thursday 9 October 2014)] Optical Metrology and Inspection for Industrial Applications III - The model about the package structure of LED and the light intensity distribution

Han, Sen, Yoshizawa, Toru, Zhang, Song, Sun, Haojie, Li, Mengyuan, Zhuang, Jie, Zhang, Dawei
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Volume:
9276
Year:
2014
Language:
english
DOI:
10.1117/12.2072496
File:
PDF, 289 KB
english, 2014
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